New microscopy concept enters into force
The first demonstration of an approach that inverts the standard paradigm of scanning probe microscopy raises the prospect of force sensing at the fundamental limit.
David's and Thomas' paper on membrane-based atomic force microscopy has been published in Physical Review Applied as an Editor's suggestion. The work is also highlighted in an external page APS Focus story, an ETH D-PHYS news article, and an external page AIP news article. The original article can be found external page here.